ZnO nanotubes have been fabricated through a carbon thermal reduction deposition process. Structure characterization results show that the ZnO nanotubes have a single crystalline wurtzite hexagonal structure pref- erentially oriented in the c-axis. The diameters of ZnO nanotubes are in the range of 90-280 nm and the wall thickness is about 50-100 nm. Room-temperature photoluminescence measurements of the ZnO nanotubes exhibit an intensive ultraviolet peak at 377 nm and a broad peak centered at about 517 nm. The UV emission is caused by the near band edge emission while the green emission may be attributed to both oxygen vacancy and the surface state. Raman and cathodoluminescence spectra are also discussed. Finally, a possible growth mechanism of the ZnO nanotubes is proposed.
The dispersion mechanism in Al0：27Ga0：73N/GaN heterostructure was investigated using frequencydependent capacitance and conductance measurements.It was found that the significant capacitance and conductance dispersion occurred primarily for measurement frequency beyond 100 kHz before the channel cutoff at the interface,suggesting that the vertical polarization electrical field under the gate metal should be closely related with the observed dispersive behavior.According to the Schottky-Read-Hall model,a traditional trapping mechanism cannot be used to explain our result.Instead,a piezoelectric polarization strain relaxation model was adopted to interpret the dispersion.By fitting the obtained capacitance data,the corresponding characteristic time and charge density were determined 10..8 s and 5.26 1012 cm..2 respectively,in good agreement with the conductance data and theoretical prediction.
We study the performance of GaN-based p i n ultraviolet （UV） photodetectors （PDs） with a 60 nm thin ptype contact layer grown on patterned sapphire substrate （PSS）. The PDs on PSS exhibit a low dark current of -2 pA under a bias of -5 V, a large UV/visible rejection ratio of-7× 10^3, and a high-quantum efficiency of -40% at 365 nm under zero bias. The average quantum efficiency of the PDs still remains above 20% in the deep-UV region from 280 to 360 nm. In addition, the noise characteristics of the PDs are also discussed, and the corresponding specific detectivities limited by the thermal noise and the low-frequency 1/f noise are calculated.
The typical light emission efficiency behaviors of InGaN/GaN multi-quantum well （MQW） blue light- emitting diodes （LEDs） grown on c-plane sapphire substrates are characterized by pulsed current operation mode in the temperature range 40 to 300 K. At temperatures lower than 80 K, the emission efficiency of the LEDs decreases approximately as an inverse square root relationship with drive current. We use an electron leakage model to explain such efficiency droop behavior; that is, the excess electron leakage into the p-side of the LEDs under high forward bias will significantly reduce the injection possibility of holes into the active layer, which in turn leads to a rapid reduction in the radiative recombination efficiency in the MQWs. Combining the electron leakage model and the quasi-neutrality principle in the p-type region, we can readily derive the inverse square root dependent function between the light emission efficiency and the drive current. It appears that the excess electron leakage into the p-type side of the LEDs is primarily responsible for the low-temperature efficiency droop behavior.
The efficiency droop behaviors of GaN-based green light-emitting diodes （LEDs） are studied as a function of temperature from 300 K to 480 K. The overall quantum efficiency of the green LEDs is found to degrade as temperature increases, which is mainly caused by activation of new non-radiative recombination centers within the LED active layer. Meanwhile, the external quantum efficiency of the green LEDs starts to decrease at low injection current level （1 A/cm2 ） with a temperature-insensitive peak-efficiency-current. In contrast, the peak-efficiency-current of a control GaN-based blue LED shows continuous up-shift at higher temperatures. Around the onset point of efficiency droop, the electroluminescence spectra of the green LEDs also exhibit a monotonic blue-shift of peak energy and a reduction of full width at half maximum as injection current increases. Carrier delocalization is believed to play an important role in causing the efficiency droop in GaN-based green LEDs.
The tetrapod ZnO nanostructures are synthesized on the Si （100） substrates using the chemical va- por deposition （CVD） method at 1000 ℃. Each nanostructure has four arms which are about 3-10 μm in length and 0.2-1.5 μm in diameter. Further analyses on structure demonstrate that the tetrapod ZnO nanostructures have single crystalline wurtzite hexagonal structure preferentially oriented in c-axis. The photoluminescence （PL） mea- surements of the tetrapod ZnO nanostructures revealed a UV peak at 382 nm corresponding to the free exciton emission, and a green peak at 523 nm arising from deep level emission. For comparative analysis, cathodolumines- cence （CL） spectra obtained from different regions of an individual tetrapod are investigated. Moreover, a possible growth mechanism of the tetrapod ZnO nanostructures is also discussed based on the experimental results.
